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DOI:
飞控与探测:2019,2(3):10-37
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超构材料红外探测芯片的研究进展
易 飞
(华中科技大学 光学与电子信息学院.湖北 武汉.430074)
Research advances in metamaterial infrared detectors
YI Fei
(School of Optical and Electronic Information,Huazhong University of Science and Technology)
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投稿时间:2019-05-09    修订日期:2019-05-09
中文摘要: 在梳理超构材料的概念与发展历程的基础上,着重分析了超构材料对波长、偏振态、相位等电磁波参量的调控作用。结合红外探测芯片及成像系统的发展趋势,介绍了超构材料与红外探测芯片的结合,及其在双色/多色成像、偏振成像、高光谱成像等先进成像模式中的应用,以及国内外相关研究进展。
Abstract:We reviewed the concepts and progresses in the area of metamaterials with the special attention directed to the manipulation of electromagnetic wave parameters such as wavelength, polarization state, and phase using metamaterials. We then discussed the trends in infrared detectors and imaging systems and focused on the research advances in merging metamaterials with infrared imaging detectors towards advanced imaging modalities such as dual-band / multi-band imaging, polarization imaging and hyperspectral imaging.
文章编号:20190509001     中图分类号:    文献标志码:
基金项目:国家自然科学基金面上项目(11774112)
引用文本:
易 飞.超构材料红外探测芯片的研究进展[J].飞控与探测,2019,2(3):10-37.

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